OP5340
Kratos SEMICONDUCTOR focuses on the research and development, manufacturing, sales, and after-sales integration services of semiconductor process equipment, providing one-stop solutions for semiconductor manufacturers' process equipment.
Keywords：
Semiconductor Equipment、Semiconductor Process
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Product Description
The Opti-Probe 5000 is used for non-contact measurement of thin film thickness on wafers. It calculates the film thickness by measuring the optical parameters (reflected light and modeled film parameters) of single or multi-layer wafer films . The Opti-Probe 5000 integrates up to six different technologies to measure film thickness and reflectivity, utilizing light sources such as lasers , white light lamps, and D2 lamps for measurement.
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